ZeeScope

ZeeScope
Hardware
ZeeScope features the most advanced properties for fast and precise 3D acquisition. Instead of using traditional motorized means such as stepper motors or piezo devices, ZeeScope uses a proprietary PhaseView optical assembly for 3D scanning, integrating the latest advances of digital lens technology for accurate and highly repeatable 3D acquisition and surface metrology

Software
ZeeScope is supplied with GUI software GetPhase. An optional API/ SDK is provided for microscopy automated systems with comprehensive 3D acquisition tools.

Applications include
  • Laser Marking Drilling Engraving
  • Failure analysis
  • Aeronautics
  • Automotive Industries
  • Tribology
  • Metal Tooling
  • QC Maintenance
  • Metal, Paint & Coatings, Ceramic, Polymers
  • Gemology
  • Museum
  • Forensics
  • Education



Click here to find out more
 
  ZeeScope 100 ZeeScope 150 ZeeScope 200
Camera CMOS 1280 x 1024 5.2?m
square pixels
30fps@full resolution		 CCD 1616 x 1216
4.40 square pixels
12fps@full resolution		 CCD 2560 x 1920
2.20 square pixels 6fps@full
resolution
Light source Built-in LED light source
Objectives Interchangeable objectives (Finite – Infinite type)
adapter provided for threads RMS and M25/0.75
Dimensions & weight
ZeeScope Head
Control unit		 225(H) x 40 (W) x 55(D) mm, 425g
Power supply 110/220V AC
PC interface USB 2.0

3D Measurement Performance

Z range and resolution are objective and c-mount coupler magnification dependant.  The table here under gives typical performance for standard objective magnification. For any other magnification, the following formulas can be applied:

Z Range = 60mm / (G_Obj )2
Z Resolution = Objective Depth Of Field /4
G_Obg = Objective magnification

Objective
Mag : NA		 Z Range (?m) Z Resolution (?m)
5X / 0.10 2400 18.5
10X / 0.25 600 3
20X / 0.45 150 1
50X / 0.8 24 0.25

Z accuracy: 1%
Z Repeatability: 0.35%
Max slope: 90° 
XY Spatial resolution determined by camera resolution and objective magnification

Roughness Measurement

12 analysis parameters are provided in total, including the frequently-used Ra (Sa), Rq (Sq), Rz (Sz), parameters. Parameters conform to ISO 4287, 25178 DIN 4768

Measuring range: Ra, Rq: 0.01-500µm Measuring accuracy: ?±10% Repeatability: Less than or equal to 6%

Field Of View – Lateral XY resolution – Depth of Field

Field of View (FOV) = (Camera (H/V) resolution * camera pixel (H/V) / (G_Obj * 0.537)
Depth of Field (DOF) = lambda / NA + pixelsize / (NA? * G_Obj * 0.537)

G_Obj = objective magnification
G_adapt = c-mount coupler magnification
Lambda = typically 0.633µm
NA = objective numerical aperture
Pixelsize = camera pixel size

Z Calibration , Certification & System Calibration

Calibration for the Z axis is performed in Phaseview factory before shipment, using step height certified calibration standard. Checking Z calibration can be easily achieved using step height calibration standard such as Rubert satndard item number 513C (optional)

A system calibration software (see software specifications) is provided for XY calibration according to objective magnification and calculation of corrected XY shift parameters to be applied along the Z axis (Z-stack). The calibration data are then stored in an internal memory of the acquisition system. Typical accessories required for the calibration (optional).


Overview

ZeeScope is supplied with the Graphics User Interface « GetPhase « and a System Calibration software. An optional API / SDK is provided for integration purpose. All software are XP, Vista, 7, 8 (32 / 64 bit) compatible, and Graphics Processor Units (GPU) compatible.

GetPhase GUI (included)

Main features:
2D / 3D acquisition modes: 2D, Z-stack, 3D roughness, 3D Shape
Multiple display modes : 3D, Phase, DIC, Darkfield, Image fusion (Extended Depth of Field)
2D / 3D analysis tools : profiles, step height, roughness, etc.
Report & Export Data

GetPhase includes 3 different methods for Z axis and 3D acquisition:

Z Height measurement / Z-Stacking: relies on the unique Z-scanning capability of the PhaseView optical assembly providing accurate and repeatable Z steps.

3D Roughness Measurement: relies on proprietary wavefront technique, for measuring surface topography in reflection. The algorithm processes a set of 2 or more images acquired within objective depth of field. This method is particularly useful for measuring small surface variations, when sample features are all in-focus, within depth of fiel of the selected objective. The 3D reconstruction is determined by the maximum slope constraint; samples with steep slopes require high objective magnification as related to objective numerical aperture (NA).

3D Shape Measurement: relies on detecting local contrast on Z image series for measuring depth map of an object. The algorithm processes Z-stack images acquired beyond the objective depth of field. This method is well adapted to samples having surface variations beyond objective depth of field. 3D reconstruction is performed when samples exhibit some texture along the Z image planes.

System_Calibration software (Included)

Main features:
XY calibration for each objective magnification
Z-stack alignment parameters calculation
Calibration data are stored in acquisition system memory

API / SDK (Optional)

An optional API/ SDK is provided for microscopy automated systems with comprehensive 3D acquisition tools.