< Model name / Chip number / Reflex side coated metal >
OMCL-AC160FS-B2 / 18 chips / Aluminum
OMCL-AC160FS-Q / 3 chips / Aluminum

    

Carbon Nano Fiber Probes (CNF)

Excellent image-retention:
The rodlike-shaped CNF probe contributes in data quality retention, even worn after the several dozen times of scanning over the rugged samples of a polysilicon thin film. It achieves consistency in the measurement and eliminates the bothersome frequent chip exchange.

High aspect ratio probe:
The thickness/width of each CNF probe at 200 nm apart from its apex is less than 50 nm. Its aspect ratio is higher than 4. The tip radius of its apex is less than 20 nm, typically 10 nm.
Such fine probe with tip-tilt-compensation enables to access small and deep pits on your sample surface.

Easy-to learn operationality:
CNF are compatible with conventional Olympus standard silicon cantilevers, OMCL-AC160TS. The compatibility brings you a stress-free usability from the very first operation.

Check Scan line profile and enlarged view of the tip apex.


Probe

A single CNF probe is formed at the apex of probe support or tetrahedral silicon tip.
Below are SEM images of a CNF probe from the front and side, and the last is a magnified view from the front.

      
Front                              Side                                Side (probe apex)        Front (probe apex)

CNF probe shape : Rod-like CNF with tip tilt compensation at 12 degrees
Probe support : Tetrahedral (tilted)
Probe material : Amorphous carbon (chief material)

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